The versatile Sensor X2 Survey is primarily used to perform leakage and scatter measurements in diagnostic X-ray applications. It is based on an array of silicon diodes with energy compensation. Unlike a pressurized ion chamber, a silicon-based sensor can be shipped by air or land without any special considerations or arrangements.
RaySafe X2 Sensor Survey
The versatile Sensor X2 Survey is mainly used to perform leakage and scatter measurements in diagnostic X-ray applications. It is…
